CONTINUOUS SCANNING

Continuous scanning offers several significant advantages in metrology and precision engineering. This advanced measurement technology enables a more in-depth and highly accurate evaluation of complex and irregular surfaces, making it ideal for industries that required detailed analysis of freeform parts and intricate geometries.

By rapidly acquiring a high number of measurement points, continuous scanning enhances data density and measurement ability.

This results in greater precision in the 3D reconstruction of objects, allowing for a clearer and more comprehensive understading of geometric deviations, surface defects, and form variations. Such capabilities are crucial in improving product quality, ensuring consistency, and meeting tight tolerance requirements in manufacturing processes.

Furthermore, continuous scanning significantly reduces times compared to traditional point-by-point probing methods. It delivers a rich and detailed representation of each component, enabling advanced analysis to optimized production processes, detect design flaws early, and identify opportunities for cost savings.

When integrated with CMMs, and other metrology systems, continuos scanning supports more efficient and accurate quality inspection workflows.

By facilitating a more thorough evaluation of dimensional tolerance, continuous scanning contributes to enhances process control and overall operational efficiency, making it an essential asset in modern industrial metrology.

TouchDMIS supports continuous scanning with SP25 or SP80 using UCC Server on Renishaw controllers equipped with scanning capability.

By selecting the SP25 or SP80 from the tools list you can simply tap on the feature and set the scanning parameters.

TouchDMIS also supports scanning on CAD slices and known and unknown curves.

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